
MD Li is presenting to PM Lee Hsien Loong

MD Li is presenting to Trade Minister Lim Hng Kiang
In conjunction with our 2011 celebrations, A*STAR produced a commemorative publication - a meaningful record of Singapore's journey in R&D showing how far we have come as a nation in the span of two decades. WinTech Nano was selected as the only Singapore enterprise to be presented in the launch event. WinTech has been working closely with A*STAR for further develop our service capability and productivity.
We wish A*Star happy 20 years birthday.

WinTech Nano MD Li Xiaomin with A*STAR Chairman Lim Chuan Poh
Congratulations to WinTech Nano Material Characterization team on the latest image sensor analysis. Image sensor is used in almost every mobile phone been produced. The pixel size and image quality is improving tremendously. It also pose increasing demand in contamination control in the image sensor. In this paper, our team is analyzing a 3 mega pixel CMOS sensor. The joint paper is published in IEEE EPTC 2011 conference.
Singapore FIB/TEM User Group Meeting is held on 20th/Oct./2011 at Raffles city Convention Center. WinTech Nano is the organizer for this year event with sponsor FEI Company. This year event attract speaker and audient from various background in Material Science, Semiconductor, Electronics, Biology, Storage. This showing increasing Electron Microscopy users in Singapore in various research applications.

The Business Times and OCBC Bank launch Emerging Enterprise award to recognise outstanding Small and Medium Enterprises (SMEs) in Singapore. WinTech Nano is the TOP15 winner in the Emerging Enterprise 2011. This award marks WinTech Nano as the leading Singapore based service laboratory in Material Characterization and Failure Analysis.
The Emerging Enterprise 2011 is co-presented by The Business Times and OCBC Bank, and supported by RSM Chio Lim, SPRING Singapore, NUS Extension, Acorn Marketing & Research, and SingTel.
Congratulations to WinTech Nano Material Characterization team on the latest graphene research. Graphene is made of a single mono layer of Carbon which is suitable for TOF-SIMS analysis. TOF-SIMS is able to analyze top 1-3 monolayer with high mass detection limit at ppm level. The joint research paper "Pyridinic N doped graphene: synthesis, electronic structure, and electrocatalytic property" was published on Journal of Materials Chemistry Issue 22, 2011

