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[2013-11] WinTech Nano’s presence in NDT in Aerospace

WinTech Nano introduced its materials characterization experience in the 5th Internatiional Symposium on NDT in Aerospace on 13~15 Nov. 2013. Many participants were interested in the analytic service of WinTech Nano and enquiring about the application of materials characterization in NDT. It's very promising for WinTech Nano to have more collaboration with the aerospace industry in future.


[2013-09] WinTech Nano Go CHINano

Having attended CHINano 2013 on 24~27 September in Suzhou, WinTech Nano built up close connections with R&D experts, nano-technology enterprise and government support in China.

CHINano is

  1. 1) a professional event multi-disciplinary gathering of research, development & commercialization experts from nanotech community home and abroad;
  2. 2) the largest Chinese business exhibition focusing on nanotechnology research and commercialization;
  3. 3) the best platform to gain latest nanotech information and achievements in Chinese high-tech market;
  4. 4) a good overview of nanotech ecosystem and capabilities in Suzhou Industrial Park.

[2013-07] WinTech Nano attended IPFA 2013

15-19 July 2013, WinTech Nano exhibited at 20th IPFA 2013(International Symposium on the Physical and Failure Analysis of Integrated Circuits) in Su Zhou, China. As a leading FA service laboratory in Asia, WinTech Nano demonstrated our full spectrum of analytic capability in failure analysis and showcased our innovative one-stop solution in the area of surface analysis, EBSD and TEM analysis. More details are available at the link below.

Application of Transition EBSD in Aluminium Metal Layer and GaAs/As Epitaxial Layers
by Dr. Shen YQ

Visualization of Crystalline Defects in Silicon, a Cause of Electrical Leakage in Semiconductor Devices
by Dr. Chow SY

Composition Distribution Studies of Sn/Ag/Cu Solder Materials Using TOF-SIMS, XPS and EDX
by Dr. Lee HS
Published on Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the Digital Object Identifier: 10.1109/IPFA.2013.6599145, Publication Year: 2013

[2013-05-09] Technical Presentation on SuZhou PCB Show 2013

On 9 May 2013, Mr. Feng Yang, Marketing Manager of WinTech Nano presented “Application of TOF-SIMS and XPS in the investigation of PCB delamination” on Su Zhou PCB Show.

[2013-05] WinTech Nano attended SuZhou PCB Show 2013

WinTech Nano participated in Su Zhou PCB show on 8~10 May, 2013. A number of manufacturers in PCB assembly showed strong interest in the analytic service provided by WinTech Nano, such as thickness measurement of metallic coating and oxidization on surface, PCB cross-section analysis, surface roughness analysis, contamination analysis on sample surface.


[2013-03] WinTech Nano attended SEMICON China 2013

Having established striking reputation in analytic service industry in Southeast Asia, WinTech Nano has been embarking on the wave of rapid development of semiconductor in China. As an exhibitor on SEMICON China 2013 in March in Shanghai, one of the key semiconductor sector trade shows in China, WinTech Nano has made sustainable connection with local manufacturers, technical team and policy makers from semiconductor sector, and more collaboration are expected in the near future.

[2013-03-08] 2013 Failure Analysis and Material Characterization Workshop in Su Zhou, China

8th Mar. 2013, WinTech Nano conducted a series of Technical Workshop at Suzhou Dushu Lake Hotel. Over 100 technical personnel from Semiconductor, hard drive, display panels, LED, nanomaterial, University and Research Institution attended the workshop.

In order to answer many enquiries regarding failure analysis and materials characterization in the manufacturing and R&D, Dr. Chen YX presented "TEM/FIB/SEM/EDX/EBSD application in Failure Analysis". Dr. Shen YQ presented "SIMS/XPS/FTIR/AFM application in Material Characterization and Surface Contamination".

Our technical experts had a constructive discussion with the participants on the latest FA development and hot topics. Through real case study, we shared insightful opinions from failure symptom to root cause identification, from yield lost to reliability improvement.


[2012-Sep] 6th SJCC Meeting Launch

The 6th Singapore-Jiangsu Cooperation Council (SJCC) meeting in Taizhou, Jiangsu on 20 September 2012. WinTech Nano MD Li Xiaomin and Director Fu Chao was participating as delegate in the SJCC. The SJCC to visting other cities in Jiangsu, including Nanjing and Wuxi. This mission will be led by the Co-Chairman of the SJCC, Mr Heng Swee Keat, Minister of Educationand Vice Co-Chairman of the SJCC, Mr Teo Ser Luck, Minister-of-State for Trade and Industry.


MD Li with Minister Mr. Heng Swee Keat


MD Li and Suzhou Mayor, Mr. Zhou Nai Xiang

[2012-Aug] WinTech Nano Suzhou is now opened!

WinTech Nano is expanding to China. The Suzhou is officially open in 2012 Aug. With the new foot stone in China, we will be even closer to the world 2nd largest economy entity.

China is transforming it economy from low end manufacturing to higher value added knowledge based economy. There are huge amount of effort undergoing to upgrade the economy structure where advance material characterization become essential. There are many customers impressed by the value provided by WinTech Nano. We will continue to grow the Suzhou operation targeting to be the top analytical solution provider in China.

[2011-11-29] WinTech Nano MD Li presented to Singapore Prime Minister Lee Hsien Loong and Trade Minister Lim Hng Kiang


MD Li is presenting to PM Lee Hsien Loong


MD Li is presenting to Trade Minister Lim Hng Kiang

[2011-11-29] WinTech Nano presented in A*Star 20 years anniversary commemorative publication launch event

In conjunction with our 2011 celebrations, A*STAR produced a commemorative publication - a meaningful record of Singapore's journey in R&D showing how far we have come as a nation in the span of two decades. WinTech Nano was selected as the only Singapore enterprise to be presented in the launch event. WinTech has been working closely with A*STAR for further develop our service capability and productivity.

We wish A*Star happy 20 years birthday.


WinTech Nano MD Li Xiaomin (left) with A*STAR Chairman Lim Chuan Poh (right)

[2011-11-16] WinTech Nano published on imaging sensor

Congratulations to WinTech Nano Material Characterization Center on the latest image sensor analysis. Image sensor is used in almost every mobile phone been produced. The pixel size and image quality is improving tremendously. It also pose increasing demand in contamination control in the image sensor. In this paper, our team is analyzing a 3 mega pixel CMOS sensor. The joint paper is published in IEEE EPTC 2011 conference.

[2011-10-20] Singapore FIB/TEM User Group Meeting

Singapore FIB/TEM User Group Meeting is held on 20th/Oct./2011 at Raffles city Convention Center. WinTech Nano is the organizer for this year event with sponsor FEI Company. This year event attract speaker and audient from various background in Material Science, Semiconductor, Electronics, Biology, Storage. This showing increasing Electron Microscopy users in Singapore in various research applications.

[2011-06-23] WinTech Nano is TOP 15 SME in Emerging Enterprise 2011

The Business Times and OCBC Bank launch Emerging Enterprise award to recognise outstanding Small and Medium Enterprises (SMEs) in Singapore. WinTech Nano is the TOP15 winner in the Emerging Enterprise 2011. This award marks WinTech Nano as the leading Singapore based service laboratory in Material Characterization and Failure Analysis.

The Emerging Enterprise 2011 is co-presented by The Business Times and OCBC Bank, and supported by RSM Chio Lim, SPRING Singapore, NUS Extension, Acorn Marketing & Research, and SingTel.

[2011-03-24] WinTech Nano in the latest graphene research

Congratulations to WinTech Nano Material Characterization Center on the latest graphene research. Graphene is made of a single mono layer of Carbon which is suitable for TOF-SIMS analysis. TOF-SIMS is able to analyze top 1-3 monolayer with high mass detection limit at ppm level. The joint research paper "Pyridinic N doped graphene: synthesis, electronic structure, and electrocatalytic property" was published on Journal of Materials Chemistry Issue 22, 2011

[2008-06] Founding member of Singapore TEM User Group
[2008-05] Certification received from Minister Of State For Trade And Industry, Mr. Lee Yi Shyan
[2008-03] International Integrate Circuit 2008, China
[2008-01] Failure Analysis Center starts at Science Park II for operation
[2007-12] Sponsored RFIT, Singapore
[2007-12] MIDAS Member
[2007-09] Singapore SME Packaging Consortium founded member


[2007-06] Sponsored IEEE-IPFA, Singapore
[2007-01] Research paper on "Applied Surface Science"
[2006-07] Participate IEEE-IPFA 2006
[2006-07] Singapore FIB Application Group
[2006-03] Participate Semicon 2006, China
[2005-11] Research project with NTU PEN center