AFM (Atomic Force Microscope)

  • Atomic Force Microscope (AFM) measures atomic surface topography, which is ideal for characterizing surface roughness at an angstrom scale.
  • Besides surface roughness, AFM can provide quantitative measurements of grain size, step height by 3D surface topographic imaging, and capacitance, phase, magnetic field by pitch imaging.

Strengths Limitations

- Quantification of surface roughness at angstrom scale
- Excellent spatial resolution
- Insulator friendly

- Possible errors induced by tips
- Limited scan area (100 microns at maximum)


More information: http://en.wikipedia.org/wiki/Atomic_force_microscope