Fault Isolation
EMMI, sometimes called PEM - Photon Emission Microscopy, is most commonly used method in semiconductor fault isolation. EMMI inspection will use CCD camera to detect any light/photon emitted from the biased the device. It is excellent tools to locate leakage current point. However, with the development of low/ultra-low power device with increasing complexity of the semiconductor device, EMMI is less likely of locating the failure point.
| Strengths | Limitations |
- Relative easy to operate |
- Photon signal been block by metallization |