Wintech Nano-Technology Services

Welcome to WinTech Nano-technology Services!

WinTech is a young and dynamic organization that is at breadth with the latest cutting-edge technology and development for the Industry. Our technical specialists are well trained with years of experience and are committed to work confidentially with you to satisfy all requirements. We are proud to be your one-stop lab service provider. Our services are highly professional yet affordable; our analyses are first class yet have the shortest turnaround time in town.


	Latest News [2011-11-29] WinTech Nano MD Li presented to Singapore Prime Minister Lee Hsien Loong and Trade Minister Lim Hng Kiang [2011-11-29] WinTech Nano presented in A*Star 20 years anniversary commemorative publication launch event [2011-11-16] WinTech Nano published on imaging sensor


	Our services Failure Analysis - Decapsulation - FIB (Focused Ion Beam) - Fault Isolation - TIVA (Thermal Induced Voltage Alteration) - SEM (Scanning Electron Microscope) - TEM (Transmission Electron Microscope) - EDX (Energy-dispersive X-ray Spectroscopy) - AFM (Atomic Force Microscope) IC Circuit Edit - Circuit Modification - Signal Tapout Material Characterization - TOF SIMS - Dynamics SIMS - TXRF (Total Reflection X-ray Spectroscopy) - AES (Auger Electron Spectroscopy) - XPS (X-ray Photoelectron Spectroscopy) - FTIR (Fourier Transform Infrared Spectroscopy) - EDX (Energy-dispersive X-ray Spectroscopy) - AFM (Atomic Force Microscope)


	Testimony "The technical support provided by Wintech is greatly appreciated. We believe with Wintech acquire of a new FIB system will certainly improve the delivery of quality results to meet Seagate's growing demand and expectation." - Li Feng, Seagate QA Director "We appreciate his technical expertise, on-time delivery and quality of work provided to us in the FIB modification services." - Simon Sim, Infineon Senior Manager

Services

Services

Failure Analysis

IC Circuit Edit

Material Characterization