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Material Characterization

Surface analysis is the characterization of the outer few atomic layers of a solid surface. It reveals properties such as morphology, crystal structure, adhesion, thickness, chemical activity, stress, wet-tability, distribution profiles, bio-compatibility, etc. These techniques are commonly utilized to analyzed surface defects at sub-micron and nanometer scales. Combined with FIB’s precise locating and cross-sectioning capability, the application of surface analysis are well-extended to 3D materials analysis, serving a wide range of industries such as Semiconductor, Data Storage, Thin Film, Polymers, and Nano Technology.