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AFM (Atomic Force Microscope)

  • Atomic Force Microscope (AFM) measures atomic surface topography, which is ideal for characterizing surface roughness at an angstrom scale.
  • Besides surface roughness, AFM can provide quantitative measurements of grain size, step height by 3D surface topographic imaging, and capacitance, phase, magnetic field by pitch imaging.

Specifications Applications

- Vertical resolution ~0.1nm
- Best lateral resolution ~7nm
- Maximum scan area 80um x 80 um
- Current range in C-AFM 10pA - 10uA
- Force range in Nanoindentation 1-100uN

- Surface topology mapping
- Surface roughness measurement
- Electrical current mapping by Conductive Module
- Hardness and Modulus by Nanoindentation Module

More information: http://en.wikipedia.org/wiki/Atomic_force_microscope