WinTech is a young and dynamic organization that is at breadth with the latest cutting-edge technology and development for the Industry. Our technical specialists are well trained with years of experience and are committed to work confidentially with you to satisfy all requirements. We are proud to be your one-stop lab service provider. Our services are highly professional yet affordable; our analyses are first class yet have the shortest turnaround time in town.

Testimony "The technical support provided by Wintech is greatly appreciated. We believe with Wintech acquire of a new FIB system will certainly improve the delivery of quality results to meet Seagate's growing demand and expectation." - Li Feng, Seagate QA Director "We appreciate his technical expertise, on-time delivery and quality of work provided to us in the FIB modification services." - Simon Sim, Infineon Senior Manager

Our services Failure Analysis - Decapsulation - Fault Isolation - SEM (Scanning Electron Microscope) - FIB Cross-section - TEM (Transmission Electron Microscope) IC Circuit Edit - Circuit Modification - Signal Tapout Material Analysis - AES - Auger Electron Spectroscopy - SIMS-Secondary Ion Mass Spectrometry - EDX- SEM; EDX-TEM - XPS X-ray Photoelectron Spectroscopy - AFM - Atomic Force Microscopy - SRP - Spreading Resistance Profilometry - FTIR - Fourier Transform InfraRed Spectroscopy

Latest News 2008.06 Founding member of Singapore TEM User Group 2008.05 Certification received from Minister Of State For Trade And Industry, Mr. Lee Yi Shyan 2008.03 International Integrate Circuit 2008, China